Labtron Atomic Force Microscope is specialized to provide high-resolution imaging of surfaces at nanoscale. They utilize cantilever to measure forces between tip and sample top layer. Their laser illuminates beam, and its reflection is captured by position-sensitive detector to quantify deflection. They feature piezoelectric actuator that moves probe over specimen in controlled way to create images. Our Atomic Force Microscope is versatile for metrology, pharmaceuticals, polymer science and semiconductors.
Operation modes: Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle
Scan angle: Random angle
Maximum scan range: X/Y axis: 20 µm, Z axis: 2 µm
Optical system/ Magnification of CCD: Magnification: 4x, Resolution: 2.5 µm
Operation modes: Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360°
Scan angle: 0 to 360°
Maximum scan range: X/Y axis: 50 µm, Z axis: 5 µm
Optical system/ Magnification of CCD: Magnification: 10x, Resolution: 1 µm
Labtron Equipment Ltd., Quatro House, Lyon Way, Camberley, Surrey GU16 7ER United Kingdom
Email: info@labtron.com Whatsapp: +44 73 4441 2688 Phone: +44 2080 043608
info@labtron.com