Atomic Force Microscope

Labtron Atomic Force Microscope is specialized to provide high-resolution imaging of surfaces at nanoscale. They utilize cantilever to measure forces between tip and sample top layer. Their laser illuminates beam, and its reflection is captured by position-sensitive detector to quantify deflection. They feature piezoelectric actuator that moves probe over specimen in controlled way to create images. Our Atomic Force Microscope is versatile for metrology, pharmaceuticals, polymer science and semiconductors.

Filter

Clear All

Microscope

Operation modes

Scan angle

Maximum scan range

Optical system/ Magnification of CCD

Atomic force microscope LAFM-A10

Atomic force microscope LAFM-A10

Operation modes: Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle

Scan angle: Random angle

Maximum scan range: X/Y axis: 20 µm, Z axis: 2 µm

Optical system/ Magnification of CCD: Magnification: 4x, Resolution: 2.5 µm

Atomic force microscope LAFM-A11

Atomic force microscope LAFM-A11

Operation modes: Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360°

Scan angle: 0 to 360°

Maximum scan range: X/Y axis: 50 µm, Z axis: 5 µm

Optical system/ Magnification of CCD: Magnification: 10x, Resolution: 1 µm


Atomic Force Microscope :
Atomic force microscope LAFM-A10, Atomic force microscope LAFM-A11, and more.

Quick Links : About Us, Contact Us, User Manuals, Career, Terms of Use, Policies, Sitemap, Gallery.

Need a Product

send details for best price quotation

Click
For

Address:Labtron Equipment Ltd., Quatro House, Lyon Way, Camberley, Surrey GU16 7ER United Kingdom

Email: info@labtron.com Whatsapp: +44 20 8004 3587 Phone: +44 2080 043608

Copyright © 2025 Labtron Equipment Ltd. All rights reserved.