Xray Fluorescence (XRF) Spectrometer

Detection Limit: 1 ppm

Elemental Content: 1 ppm to 99 %

Temperature Range: 15°C to 30°C

Temperature Repeatability: 0.001

Analyzable elements: Sulfur (S) to Uranium (U)

Detection limit of the analysis: 1 ppm

Analyzable content: 1 ppm to 99.99%

Detector: SDD Detector

Measurable Elements: Sodium (Na) to Uranium (U )

Precision: 0.0005

Analytical Range: ppm to 99.99 %

Analysis Time: 60 sec to 200 sec

Analytical Method: Energy dispersive X-ray fluorescence analytical Method

Elements Measuring: Atomic number from 12 to 92 [elements from magnesium (Mg) to uranium (U)] can be measured

Range: Simultaneous detector

Content measurement range: ppm to 100%

Analytical Method: Energy-Dispersive X-Ray Fluorescence

Elements Measuring Range: Atomic Number From 12 To 92 [Magnesium (Mg) To Uranium (U)]

Elements Analysis Limit: 40 Elements (Simultaneous)

Measurement Range: ppm to 99.99%

Analytical Method: Energy Dispersive X-ray Fluorescence

Elements Measuring Range: Atomic number 12 to 92 (Magnesium to Uranium)

Elements Analysis Limit: Up to 40 elements

System: Customized microcomputer system; CPU: 1G; RAM: 1G; Storage: 4G standard (expandable up to 32G)

Detector: SDD detector

Accuracy: 0.05% (content is greater than 96%)

Range of Detection: All 30 elements between Mg and U

Display System: 4.3 inch resistive touch screen

X-Ray Source: X-ray Tube with Ag anode (6 to 45 kV, 1 to 200 µA, 2 W max)

Detector: Silicone drift detector (SDD)

Range of Detection: All 30 elements between Mg and U

Display System: Fixed-angle, color resistive touchscreen