XRF-Spectrometer LXRF-A10 is a microprocessor controlled high-count throughput unit with low detection limits for wide range of elements. Provision of multi-elemental analysis with detection limits upto 1 ppm. Built-in movable platform for easy location of testing point.High resolution detector improves analysis accuracy. Equipped with safety features of optical tube shielding with no X-ray radiation and high voltage emergency locking.
|Measureable elements||S to U|
|Detection limit||1 ppm|
|Temperature||15 ~ 30 °C|
|Elemental content||1 ppm to 99 %|
|Power supply||AC 220 V ± 5 V|
|Dimensions||550 x 410 x 320 mm|
Used in detection of plating thickness of metals, concentration of plating solution , RoHS detection and analysis, full-element analysis and electro plating industries