XRF-Spectrometer LXRF-A10


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XRF-Spectrometer LXRF-A10


XRF-Spectrometer LXRF-A10 is a microprocessor controlled high-count throughput unit with low detection limits for wide range of elements. Provision of multi-elemental analysis with detection limits upto 1 ppm. Built-in movable platform for easy location of testing point.High resolution detector improves analysis accuracy. Equipped with safety features of optical tube shielding with no X-ray radiation and high voltage emergency locking.



Available Range :

Measureable elements : S to U
Measureable elements S to U
Detection limit 1 ppm
Temperature 15 ~ 30 °C
Elemental content 1 ppm to 99 %
Repeatability 0.001
Stability 0.001
Power supply AC 220 V ± 5 V
Dimensions 550 x 410 x 320 mm
Weight 45 kg
  • Detection limit – 1 ppm
  • Measureable elements – S to U
  • Elemental content – 1 ppm to 99 %
  • Movable sample platform for easy detection of testing point
  • Built-in electric cooling Si-PIN detector
  • Safety features - optical tube shielding with no X-ray radiation and high voltage emergency locking

Used in detection of plating thickness of metals, concentration of plating solution , RoHS detection and analysis, full-element analysis and electro plating industries

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