Atomic force microscope LAFM-A10

Name: Atomic force microscope LAFM-A10
Brand: Labtron
SKU: LAFM-A10
Rating: 4.7 (663 reviews)

Atomic force microscope LAFM-A10 comes with combined design of scan head and sample stage so as to give strong anti-vibration performance. It’s equipped with precision laser detection and probe alignment device for simple & easy adjustment of laser beam.

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Operation modes	Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle
Scan angle	Random angle
Maximum scan range	X/Y axis: 20 µm, Z axis: 2 µm
Optical system/ Magnification of CCD	Magnification: 4x, Resolution: 2.5 µm
Resolution	X/Y axis: 0.2 nm, Z axis: 0.05 nm
Sample size	Ø≤ 90 mm, H≤ 20 mm
Sample movement	0 to 20 mm
Pulse width of approaching motor	10 ± 2 ms
Scan rate	0.6 Hz to 4.34 Hz
Scanning control	XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously
Types of sampling pixel	256×256, 512×512
Feedback type	DSP digital feedback
Feedback sampling rate	64 KHz
PC connections:	USB 2.0
Windows software	Compatible with windows 98/2000/XP/7/8
Instrument Diemnsion	415 × 410 × 545 mm
Net weight	40 kg
Gross Weight	50 kg

Large range of sample transfer
Modular electronic system for easy maintenance
Adopted with spring for vibration isolation
Provides highly accurate results
Optical observation system for checking tip & sample’s position

2 types of sampling pixel for selection (256×256, 512×512)
Selection of an area of interest for sampling by executing scan area move and cut function
Scans sample in random angle at beginning
Adjustment of laser spot detection system in real time
Selection and setting for different color scanning images in palette
Supports linear average and offset calibration in real time for sample title
Supports scanner sensitivity calibration and electronic controller auto-calibration
Supports offline analysis and process of sample image

It finds best solution for applications in biochemistry for tissues, cells, cellular components imaging, nanotechnology for imaging of polymers, nanomaterials, and in chemistry physics for imaging of surface metals elements.

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Atomic force microscope LAFM-A10 Catalog

Available Range :

Atomic force microscope LAFM-A11 : Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360° Atomic force microscope LAFM-A10 : Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle

Models of Atomic Force Microscope

Labtron Atomic Force Microscope is specialized to provide high-resolution imaging of surfaces at nanoscale. They utilize cantilever to measure forces between tip and sample top layer. Their laser illuminates beam, and its reflection is captured by position-sensitive detector to quantify deflection. They feature piezoelectric actuator that moves probe over specimen in controlled way to create images. Our Atomic Force Microscope is versatile for metrology, pharmaceuticals, polymer science and semiconductors.