Labtron Scanning Electron Microscope provide high magnification observation of specimens. Their detectors capture secondary charge carriers emitted from sample, enhancing surface detail visualization. They are equipped with subatomic particle beam including tungsten filament or field emission gun to scan interface. Their stage allows for correct positioning and tilting for multi-angle observation of structures. Our Scanning Electron Microscope does analysis in materials science, nanotechnology, semiconductors, forensics, geology and agriculture.
Magnification: 1 x to 2,500,000 x
Resolution: 1.0 nm at 15 kV (SE), 1.5 nm at 1 kV (SE), 0.8 nm at 30 kV (STEM)
Voltage: 20 V to 30 kV
Electron Gun: Schottky Field Emission Electron Gun, In-cylinder Deceleration, Electromagnetic Composite Objective, Water-cooled Thermostatic Objective
Labtron Equipment Ltd., Quatro House, Lyon Way, Camberley, Surrey GU16 7ER United Kingdom
Email: info@labtron.com Whatsapp: +44 73 4441 2688 Phone: +44 2080 043608
info@labtron.com