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Scanning Electron Microscope LSEM-A10

Scanning Electron Microscope LSEM-A10

Scanning Electron Microscope LSEM-A10 provides high brightness for achieving excellent quality images. It offers magnification of 1 to 2,500,000 x and has an accelerating voltage of 20 V to 30 kV. The main goal of a microscope is to yield high-resolution imaging and effective navigation. Devices have a wide range of applications in various scientific and industrial fields.

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Magnification 1 x to 2,500,000 x
Resolution 1.0 nm at 15 kV (SE), 1.5 nm at 1 kV (SE), 0.8 nm at 30 kV (STEM)
Voltage 20 V to 30 kV
Electron Gun Schottky Field Emission Electron Gun, In-cylinder Deceleration, Electromagnetic Composite Objective, Water-cooled Thermostatic Objective
Vacuum System
TypeFully Auto Control Oil Free Vacuum
Sample Room pressure< 5×10-4 Pa
Electron Gun pressure< 9 ×10-8 Pa
Vacuum Pump
Mechanical pump flow rate> 6 m3/h
Turbo molecular pump flow rate> 240 L/s
Ion pump flow rate>25 L/s
Working Stage 5 Axes Auto Stage, X:120 mm, Y:115 mm, Z:50 mm, T: -10° to + 90°, R: 360°
Camera Vertical Optical Navigation CCD, Horizontal Monitoring CCD
Detector Secondary Electron Detector (ETD), High Angle Electron Detector In lens
Software SEM Operation Software
Display Multi-Channel Display
Navigation Gesture navigation
Image enhancement features Auto Brightness Contrast, Auto Focus, Auto Astigmatism
Image format support TIFF, JPG, BMP, PNG
Computer specification Working Station, Memory: 16 G, Hard Disk: 512 G, 24-inch Monitor, Win10 operating system
Installation Room
DimensionL > 3000 mm, W > 4000 mm, H > 2300 mm
Temperature20 to 25 ℃
Humidity< 50%
Power Supply AC 220 V (±10 %), 50 Hz,2 kVA
  • High-pressure Super Tunnel technology ensures resolution at low voltage
  • No crossover in the electronic optic path improves resolution
  • Water cooling constant temperature objective lens ensures stability
  • HD photos of sample station helps in quick sample location
  • Quick adjustment of astigmatism for improved imaging
  • One-click functions enables fast imaging
  • Adjusts brightness and contrast for optimal image clarity
  • Allows for widefield observation to obtain overall morphology
  • Rich scalability of Scanning Electron Microscope

Scanning Electron Microscope has wide range of applications across different fields such as chemical, biomedical, environmental protection, nanotechnology, etc.

BSE (Backscattering Electron) Detector


EDS (Energy Dispersive Spectroscopy)
EBSD (Electron Backscatter Diffraction)
EDS + EBSD System
STEM (Scanning Transmission Electron Microscopy)
EBIC (Electron Beam-Induced Current)
CL (Cathodoluminescence)
Knob Control Panel & Trackball
Sample Exchange System
Beam Gate & Electron Optics
Low Vacuum Detector (LV Module, Works with BSE)
Double Anode (Tetrode)
Tungsten Filament (6 pcs in 1 box)
Large Size Image Stitching Software

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