Scanning Electron Microscope LSEM-A10

Name: Scanning Electron Microscope LSEM-A10
Brand: Labtron
SKU: LSEM-A10
Rating: 4.9 (811 reviews)

Scanning Electron Microscope LSEM-A10 provides high brightness for achieving excellent quality images. It offers magnification of 1 to 2,500,000 x and has an accelerating voltage of 20 V to 30 kV. The main goal of a microscope is to yield high-resolution imaging and effective navigation. Devices have a wide range of applications in various scientific and industrial fields.

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Magnification

1 x to 2,500,000 x

Resolution

1.0 nm at 15 kV (SE), 1.5 nm at 1 kV (SE), 0.8 nm at 30 kV (STEM)

Voltage

20 V to 30 kV

Electron Gun

Schottky Field Emission Electron Gun, In-cylinder Deceleration, Electromagnetic Composite Objective, Water-cooled Thermostatic Objective

Vacuum System

Type	Fully Auto Control Oil Free Vacuum
Sample Room pressure	< 5×10-4 Pa
Electron Gun pressure	< 9 ×10-8 Pa

Vacuum Pump

Mechanical pump flow rate	> 6 m3/h
Turbo molecular pump flow rate	> 240 L/s
Ion pump flow rate	>25 L/s

Working Stage

5 Axes Auto Stage, X：120 mm, Y：115 mm, Z：50 mm, T: -10° to + 90°, R: 360°

Camera

Vertical Optical Navigation CCD, Horizontal Monitoring CCD

Detector

Secondary Electron Detector (ETD), High Angle Electron Detector In lens

Software

SEM Operation Software

Display

Multi-Channel Display

Navigation

Gesture navigation

Image enhancement features

Auto Brightness Contrast, Auto Focus, Auto Astigmatism

Image format support

TIFF, JPG, BMP, PNG

Computer specification

Working Station, Memory: 16 G, Hard Disk: 512 G, 24-inch Monitor, Win10 operating system

Installation Room

Dimension	L > 3000 mm, W > 4000 mm, H > 2300 mm
Temperature	20 to 25 ℃
Humidity	< 50%

Power Supply

AC 220 V (±10 %), 50 Hz，2 kVA

High-pressure Super Tunnel technology ensures resolution at low voltage
No crossover in the electronic optic path improves resolution
Water cooling constant temperature objective lens ensures stability
HD photos of sample station helps in quick sample location
Quick adjustment of astigmatism for improved imaging
One-click functions enables fast imaging
Adjusts brightness and contrast for optimal image clarity
Allows for widefield observation to obtain overall morphology
Rich scalability of Scanning Electron Microscope

Scanning Electron Microscope has wide range of applications across different fields such as chemical, biomedical, environmental protection, nanotechnology, etc.

BSE (Backscattering Electron) Detector

EDS (Energy Dispersive Spectroscopy)

EBSD (Electron Backscatter Diffraction)

EDS + EBSD System

STEM (Scanning Transmission Electron Microscopy)

EBIC (Electron Beam-Induced Current)

CL (Cathodoluminescence)

Knob Control Panel & Trackball

Sample Exchange System

Beam Gate & Electron Optics

Low Vacuum Detector (LV Module, Works with BSE)

Double Anode (Tetrode)