Scanning Electron Microscope LSEM-A10 Catalog

Overview

Scanning Electron Microscope LSEM-A10 provides high brightness for achieving excellent quality images. It offers magnification of 1 to 2,500,000 x and has an accelerating voltage of 20 V to 30 kV. The main goal of a microscope is to yield high-resolution imaging and effective navigation. Devices have a wide range of applications in various scientific and industrial fields.

Features :

• • High-pressure Super Tunnel technology ensures resolution at low voltage
  • No crossover in the electronic optic path improves resolution
  • Water cooling constant temperature objective lens ensures stability
  • HD photos of sample station helps in quick sample location
  • Quick adjustment of astigmatism for improved imaging
  • One-click functions enables fast imaging
  • Adjusts brightness and contrast for optimal image clarity
  • Allows for widefield observation to obtain overall morphology
  • Rich scalability of Scanning Electron Microscope

Specifications :

Magnification	1 x to 2,500,000 x
Resolution	1.0 nm at 15 kV (SE), 1.5 nm at 1 kV (SE), 0.8 nm at 30 kV (STEM)
Voltage	20 V to 30 kV
Electron Gun	Schottky Field Emission Electron Gun, In-cylinder Deceleration, Electromagnetic Composite Objective, Water-cooled Thermostatic Objective
Vacuum System	Type Fully Auto Control Oil Free Vacuum Sample Room pressure < 5×10-4 Pa Electron Gun pressure < 9 ×10-8 Pa
Vacuum Pump	Mechanical pump flow rate > 6 m3/h Turbo molecular pump flow rate > 240 L/s Ion pump flow rate >25 L/s
Working Stage	5 Axes Auto Stage, X：120 mm, Y：115 mm, Z：50 mm, T: -10° to + 90°, R: 360°
Camera	Vertical Optical Navigation CCD, Horizontal Monitoring CCD
Detector	Secondary Electron Detector (ETD), High Angle Electron Detector In lens
Software	SEM Operation Software
Display	Multi-Channel Display
Navigation	Gesture navigation
Image enhancement features	Auto Brightness Contrast, Auto Focus, Auto Astigmatism
Image format support	TIFF, JPG, BMP, PNG
Computer specification	Working Station, Memory: 16 G, Hard Disk: 512 G, 24-inch Monitor, Win10 operating system
Installation Room	Dimension L > 3000 mm, W > 4000 mm, H > 2300 mm Temperature 20 to 25 ℃ Humidity < 50%
Power Supply	AC 220 V (±10 %), 50 Hz，2 kVA

Applications :

Scanning Electron Microscope has wide range of applications across different fields such as chemical, biomedical, environmental protection, nanotechnology, etc.

Optional Accessories :

BSE (Backscattering Electron) Detector

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EDS (Energy Dispersive Spectroscopy)

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EBSD (Electron Backscatter Diffraction)

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EDS + EBSD System

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STEM (Scanning Transmission Electron Microscopy)

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EBIC (Electron Beam-Induced Current)

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CL (Cathodoluminescence)

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Knob Control Panel & Trackball

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Sample Exchange System

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Beam Gate & Electron Optics

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Low Vacuum Detector (LV Module, Works with BSE)

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Double Anode (Tetrode)

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Tungsten Filament (6 pcs in 1 box)

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Large Size Image Stitching Software