Scanning Electron Microscope LSEM-A10 Catalog

Scanning Electron Microscope LSEM-A10

Overview

Scanning Electron Microscope LSEM-A10 provides high brightness for achieving excellent quality images. It offers magnification of 1 to 2,500,000 x and has an accelerating voltage of 20 V to 30 kV. The main goal of a microscope is to yield high-resolution imaging and effective navigation. Devices have a wide range of applications in various scientific and industrial fields.

Specifications :

Magnification

1 x to 2,500,000 x

Resolution

1.0 nm at 15 kV (SE), 1.5 nm at 1 kV (SE), 0.8 nm at 30 kV (STEM)

Voltage

20 V to 30 kV

Electron Gun

Schottky Field Emission Electron Gun, In-cylinder Deceleration, Electromagnetic Composite Objective, Water-cooled Thermostatic Objective

Vacuum System

Type	Fully Auto Control Oil Free Vacuum
Sample Room pressure	< 5×10-4 Pa
Electron Gun pressure	< 9 ×10-8 Pa

Vacuum Pump

Mechanical pump flow rate	> 6 m3/h
Turbo molecular pump flow rate	> 240 L/s
Ion pump flow rate	>25 L/s

Working Stage

5 Axes Auto Stage, X：120 mm, Y：115 mm, Z：50 mm, T: -10° to + 90°, R: 360°

Camera

Vertical Optical Navigation CCD, Horizontal Monitoring CCD

Detector

Secondary Electron Detector (ETD), High Angle Electron Detector In lens

Software

SEM Operation Software

Display

Multi-Channel Display

Navigation

Gesture navigation

Image enhancement features

Auto Brightness Contrast, Auto Focus, Auto Astigmatism

Image format support

TIFF, JPG, BMP, PNG

Computer specification

Working Station, Memory: 16 G, Hard Disk: 512 G, 24-inch Monitor, Win10 operating system

Installation Room

Dimension	L > 3000 mm, W > 4000 mm, H > 2300 mm
Temperature	20 to 25 ℃
Humidity	< 50%

Power Supply

AC 220 V (±10 %), 50 Hz，2 kVA

Features :

- High-pressure Super Tunnel technology ensures resolution at low voltage
- No crossover in the electronic optic path improves resolution
- Water cooling constant temperature objective lens ensures stability
- HD photos of sample station helps in quick sample location
- Quick adjustment of astigmatism for improved imaging
- One-click functions enables fast imaging
- Adjusts brightness and contrast for optimal image clarity
- Allows for widefield observation to obtain overall morphology
- Rich scalability of Scanning Electron Microscope

Applications :

Scanning Electron Microscope has wide range of applications across different fields such as chemical, biomedical, environmental protection, nanotechnology, etc.

Optional Accessories :

BSE (Backscattering Electron) Detector EDS (Energy Dispersive Spectroscopy) EBSD (Electron Backscatter Diffraction) EDS + EBSD System STEM (Scanning Transmission Electron Microscopy) EBIC (Electron Beam-Induced Current) CL (Cathodoluminescence) Knob Control Panel & Trackball Sample Exchange System Beam Gate & Electron Optics Low Vacuum Detector (LV Module, Works with BSE) Double Anode (Tetrode) Tungsten Filament (6 pcs in 1 box) Large Size Image Stitching Software

Labtron Equipment Ltd. Quatro House, Lyon Way, Camberley, Surrey GU16 7ER United Kingdom
Email: info@labtron.com | Website: www.labtron.com