XRD Diffractometer LXRD-A10 boasts a tube current capacity spanning from 5 to 80 mA with a tube voltage range of 10 to 60 kV. Equipped with a range of X-ray tube options including glass, ceramic, and ripple ceramic tubes. Enhanced with an auto-switching dual wavelength optic. It offers phase identification for unknown samples and phase analysis for known mixed samples. Our system maintains peak performance over time, reducing downtime and ensuring consistent results.
Request QuoteX-ray Tube | Glass tube, Ceramic tube, Ripple Ceramic tube |
X-Ray Source Material | Cu, Fe, Co, Cr, Mo, etc., |
Focus Size | 1 × 10 mm/ 0.4 × 14 mm/ 2 × 12 mm |
Stability | ≤ 0.01 % |
Tube Current | 5 to 80 mA |
Tube Voltage | 10 to 60 kV |
Rated Power | 3 kW |
Goniometer Structure | Horizontal (Ø to 2 Ø ) |
Radius of Diffraction | 185 mm |
Scanning Range | 0 to 164 |
Scanning Speed | 0.0012º to 70 º min |
Maximum Resolving Speed | 100 º / min |
Scanning Mode | Ø to 2 Ø linkage, Ø, 2 Ø single action; continuous/stepping |
Angle Repeatable Accuracy | 1 / 1000 º |
Minimal Stepping Angle | 1 / 1000 º |
Detector | Proportional/Scintillation counters |
Linearity Count | 5 × 105 CPS |
Energy Resolution | ≤ 25 % (PC), ≤ 50 % (SC) |
Counting Fashion | Differential Coefficient / integral, PHA automatically, Dead time regulate |
Stability of System measure | ≤ 0.01 % |
Scattered Rays Dose | ≤ 1 µ Sv/h |
Integrative Stability | ≤ 0.5 % |
Dimension | 1100 × 850 × 1750 mm |
Weight | 25 kg |
XRD Diffractometer is used in materials science, chemistry, and mineralogy to characterize and measure crystalline structures, phase composition, crystallite size, and orientation of the sample.
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XRD Diffractometer LXRD-A10
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XRD Diffractometer LXRD-A10
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XRD Diffractometer LXRD-A10 is coupled with an auto-switching dual wavelength optic with a horizontal goniometer structure. For testing unknown samples it has “phase identification” and “phase analysis” for known mixed samples.
An "auto-switching dual wavelength optic" typically refers to a component in an X-ray diffractometer (XRD) that automatically allows the instrument to switch between different X-ray wavelengths. This feature is particularly useful in XRD analysis because different wavelengths of X-rays interact differently with materials and can provide complementary information about the sample's crystal structure.
Anemometer is a device used to measure the speed and direction of the wind. It is a common tool in meteorology, aerodynamics, environmental science and weather report stations where we get daily updates on the weather.
XRD Diffractometer is a scientific instrument used to analyze the crystalline structure of materials by measuring the diffraction patterns produced when X-rays interact with the atomic structure of a sample.
The physics scientist “Max Von Laue” invented the X-ray diffraction.
It is widely used in chemistry, physics, geology, and other fields to identify and characterize crystalline phases, determine crystallography properties and investigate structural changes in materials.
The objectives of X-ray Diffractometer are Material characterization, Phase identification, Quantitative analysis, Crystallography, Stress and strain analysis, Texture analysis, Phase transformation analysis and Defect analysis.
X-ray tube, sample holder, X-ray detector, collimators, Goniometer, collimators, analyzer crystals, data display and output screens, scintillation counters.
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