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XRD Diffractometer LXRD-B10

XRD Diffractometer LXRD-B10

XRD Diffractometer LXRD-B10 offers a scanning speed range from 0.0012° to 50°/min and a 2θ scanning range from -6° to 160°. It is supported by a high-precision diffraction angle measuring system. Its integrated design features a metal-ceramic tube compatible with multiple target materials. This unit comes with a PC or SC, an SDD, and a high-speed 1D semiconductor array detector for fast operation. Our multifunctional diffractometer ensures superior performance and accurate results by combining advanced hardware and software systems.
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X-Ray Tube Metal ceramic tube: Cu, Fe, Co, Cr, Mo, etc
Focus Size 1×10 mm, 0.4×14 mm or 2×12 mm
Stability ≤ 0.005%
Tube Power 2.4 kW
Tube Current 5 to 50 mA
Tube Voltage 10 to 60 kV
Rated Power 3 kV (HV, HF control technology)
Goniometer Structure Sample level (θ to θ)
Diffraction Radius 225 mm
2θ Scanning Range -6 to 160°
Scanning Speed 0.0012° to 50°/min
Scanning Mode θs/θd Linkage, Single Action, Continuous Scanning, Stepping, Omega Scanning.
Minimal Stepping Angle 1/10000°
Angle Repeatable Accuracy 1/10000°
Diffraction Angle Accuracy 2θ Angular Linearity
International Standard Sample Si (Silicon) or Al₂O₃ (Alumina)
Angle Deviation ±0.022°
Angle Locating Speed 1500°/min
Detector Proportional Counters (PC)
Scintillation Counter (SC)
Silicon Drift Detector (SDD)
One-Dimensional Array Detector
Maximum Linear Count Rate >5×105 cps (PC, SC with the compensate function of miss counting), 15×104 (SSD), 9×102 (1D array)
Energy Resolution Ratio ≤ 25%(PC, one-dimensional array), ≤ 50% (SC), ≤ 200 eV (SDD)
Counting Fashion Differential coefficient or integral, PHA automatically, dead time regulate
System Measure Stability ≤ 0.01%
Scattered Ray Dose 1uSv/h
01 Box Package Dimension (L×W×H) 1190 × 1020 × 2000 mm
02 Box Package Dimension (L×W×H) 1250 × 1035 × 1050 mm
01 Box Gross Weight 350 kg
02 Box Gross Weight 240 kg
Machine Dimension (L×W×H) 1000 × 800 × 1600 mm
Net Weight 340 kg
  • Various counting and scanning modes
  • An X-ray generator control system
  • High-frequency, high-voltage control technology
  • Supports programmable operation
  • Sample level (θ to θ) goniometer structure
  • Performs multiple tests using functional Accessories
XRD diffractometer is used to analyze natural or synthetic inorganic or organic materials, widely used in clay minerals, cement building materials, environmental dust, chemical products, drugs, asbestos, rock minerals, polymers, and other research fields.
Crystal graphite monochromator
1D Silicon strip-based fast detector
Sample Auto changer
Graphite monochromator
Laser positioning lifting rotating sample table
Multifunctional sample table (Texture, Stress, Thin-film Phi scanning)
Multi-layer reflector
Battery in-situ attachment
Low background sample holder
High-temperature attachment
Low-temperature attachment
Metal Ceramic X-ray Tube
XRD Diffractometer LXRD-B10 _ Focus Size - 1×10 mm, 0.4×14 mm or 2×12 mm.

Models of XRD Diffractometer

Labtron XRD Diffractometer utilizes versatile X-ray tubes with source materials such as Cu, Fe, Co, Cr, and Mo. They are equipped with proportional and scintillation counters. Our XRD diffractometer delivers great energy resolution and accurate data collection. Their advanced goniometer structures guarantee reliable and repeatable measurements. Safety is a priority for our diffractometers, which protect against current leakage, overload, over-current, and over-temperature.

XRD Diffractometer LXRD-A10

XRD Diffractometer LXRD-A10

  • X-ray Tube : Glass tube, Ceramic tube, Ripple Ceramic tube
  • X-Ray Source Material : Cu, Fe, Co, Cr, Mo, etc.,
  • Focus Size : 1 × 10 mm/ 0.4 × 14 mm/ 2 × 12 mm
  • Stability : ≤ 0.01 %
XRD Diffractometer LXRD-C10

XRD Diffractometer LXRD-C10

  • Target Material Type : Cu, Fe, Co, Cr, Mo, Ti, W, etc. Corrugated ceramic tube or metal ceramic tube
  • Focus Size : 1 × 10 mm², 0.4 × 14 mm², or 0.2 × 12 mm²
  • Output Stability : ≤ 0.005% (at power supply voltage fluctuation of 10%)
  • Structure of Angle Measuring Instrument : Vertical angle measuring instrument with θs - θd structure (using a 224-bit absolute incremental grating to record diffraction angles)

XRD Diffractometer LXRD-B10 FAQ's
  • The X-ray tube used in XRD Diffractometer LXRE-B10 is a metal ceramic tube made up of Cu, Fe, Co, Cr, Mo etc. Its diffraction radius is 225mm. Tube current is 5 to 50 mA and Tube voltage is 10 to 60 kV. It has interlocking and alarm systems.

  • XRD Diffractometer LXRE-B10 has different ranges of focus sizes. They are 1×10 mm, 0.4×14 mm or 2×12 mm.

  • XRD Diffractometer LXRE-B10 is a multifunctional unit with a perfect combination of hardware and software systems that gives accurate measurement results with a scanning speed of 0.0012° to 50°/min and includes safety features to protect users from radiation exposure.

  • XRD Diffractometer is a scientific instrument used to analyze the crystalline structure of materials by measuring the diffraction patterns produced when X-rays interact with the atomic structure of a sample.

  • The physics scientist “Max Von Laue” invented the X-ray diffraction.

  • It is widely used in chemistry, physics, geology, and other fields to identify and characterize crystalline phases, determine crystallography properties and investigate structural changes in materials.

  • The objectives of X-ray Diffractometer are Material characterization, Phase identification, Quantitative analysis, Crystallography, Stress and strain analysis, Texture analysis, Phase transformation analysis and Defect analysis.

  • X-ray tube, sample holder, X-ray detector, collimators, Goniometer, collimators, analyzer crystals, data display and output screens, scintillation counters.

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Email: info@labtron.com

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Labtron Equipment Ltd., Quatro House, Lyon Way, Camberley, Surrey GU16 7ER United Kingdom

Email: info@labtron.com Whatsapp: +44 73 4441 2688 Phone: +44 2080 043608

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