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| Target Material Type | Cu, Fe, Co, Cr, Mo, Ti, W, etc. Corrugated ceramic tube or metal ceramic tube |
| Focus Size | 1 × 10 mm², 0.4 × 14 mm², or 0.2 × 12 mm² |
| Output Stability | ≤ 0.005% (at power supply voltage fluctuation of 10%) |
| Structure of Angle Measuring Instrument | Vertical angle measuring instrument with θs - θd structure (using a 224-bit absolute incremental grating to record diffraction angles) |
| Scanning Radius | Standard 225 mm (150 to 325 mm continuously adjustable) |
| Scanning Range | -110° to 161° |
| Scanning Speed | 0.0012° to 120°/min |
| Drive Mode | Stepping, Continuous, OMG, Transmission |
| Scanning Method | θs - θd linkage θs or θd single action |
| Minimum Stepping Angle | 0.0001° |
| 2θ Angle Repeatability Accuracy | 0.0001° |
| Angle Positioning Speed | 1500°/min (2θ) |
| Linearity of Full Spectrum Diffraction Angle | ≤ ±0.01° (International Standards) |
| Detector Type | Array detector SDD detector |
| Spectral Resolution | 687 ± 5 eV (rms) (MYTHEN) 125 eV (SDD) |
| Maximum Linear Count Rate | 1 × 10⁹ CPS, no noise (MYTHEN) 1 × 10⁵ CPS, noise ≤ 0.2 CPS |
| Safety Indicators | Electronic protection system Lead door interlocking device Dual protection |
| X-ray Leakage | ≤ 0.12 µSv/h (at maximum X-ray tube power) |
| Comprehensive Stability | ≤ 0.3% (40 kV, 40 mA, continuous operation for 8 hours) |
| High-Frequency Generator | 3 kW high-frequency and high-voltage solid-state generator |
| X-ray Tube Voltage | 10 to 60 kV, 1 kV/step |
| X-ray Tube Current | 2 to 60 mA, 1 mA/step |
| Maximum Output Power | 2.4 kW |
| Dimensions (L × W × H) | 1300 × 1000 × 1800 mm |
| Packaging Dimensions | 1500 ×1200 × 2200 mm |
| Net Weight | 1400 kg |
| Gross Weight | 2200 kg |
Our XRD Diffractometer LXRD-C10 is mainly used for phase qualitative and quantitative analysis, crystal structure and orientation studies, material structure evaluation, as well as macroscopic and microscopic stress determination.
| Accessories Name | Quantity |
| High resolution one-dimensional array detector | 1 pc |
| Graphite bent crystal monochromator | 1 pc |
| Accessory for low/middle temperature | 1 pc |
| Accessory for high temperature | 1 pc |
| Parallel light thin film measurement accessory | 1 pc |
| Small angle diffraction attachment | 1 pc |
| Multi-functional integrated measurement accessory | 1 pc |
| 6/12-bit automatic sample changer | 1 pc |
| Specimen rotating holder | 1 pc |
| In situ battery accessories | 1 pc |
| Multi-functional sample table | 1 pc |
| Fiber measuring accessory | 1 pc |
| Specialized X-ray tube | 1 pc |
| System | Components | Quantity |
| High frequency and high voltage solid-state X-ray generator | 1. High voltage control unit | 1 PCS |
| 2. High voltage transformer | 1 PCS | |
| 3. X-ray tube sleeve body | 1 PCS | |
| 4. High voltage cable (dielectric voltage 100kV) | 1 PCS | |
| 5. X-ray tube (Cu target 2.4kW) | 1 PCS | |
| Goniometer system | 1. Vertical angle measuring instrument | 1 PCS |
| 2. Angle measuring instrument support plate | 1 PCS | |
| 3. Powder sample rack | 1 PCS | |
| 4. Clump weight | 1 PCS | |
| 5. Slit | 1 PCS | |
| 6. Filters | 1 PCS | |
| Circulating cooling water device | 1. Refrigeration and cooling device | 1 PCS |
| 2. Water pipe | 2 PCS | |
| 3. Power cable | 1 PCS | |
| 4. Control and detect cables | 1 PCS | |
| Record control unit | 1. Record control unit (PLC control) | 1 PCS |
| 2. Array detector and cable | 1 PCS | |
| 3. Stepper motor cable | 2 PCS | |
| Microcomputer system (printer) | Dual core CPU, RAM 4G, Hard drive 500GB | 1 PCS |
| 1. Instrument control software | 1 PCS |
Download catalog for
XRD Diffractometer LXRD-C10 Catalog
Labtron XRD Diffractometer utilizes versatile X-ray tubes with source materials such as Cu, Fe, Co, Cr, and Mo. They are equipped with proportional and scintillation counters. Our XRD diffractometer delivers great energy resolution and accurate data collection. Their advanced goniometer structures guarantee reliable and repeatable measurements. Safety is a priority for our diffractometers, which protect against current leakage, overload, over-current, and over-temperature.
XRD Diffractometer is a scientific instrument used to analyze the crystalline structure of materials by measuring the diffraction patterns produced when X-rays interact with the atomic structure of a sample.
The physics scientist “Max Von Laue” invented the X-ray diffraction.
It is widely used in chemistry, physics, geology, and other fields to identify and characterize crystalline phases, determine crystallography properties and investigate structural changes in materials.
The objectives of X-ray Diffractometer are Material characterization, Phase identification, Quantitative analysis, Crystallography, Stress and strain analysis, Texture analysis, Phase transformation analysis and Defect analysis.
X-ray tube, sample holder, X-ray detector, collimators, Goniometer, collimators, analyzer crystals, data display and output screens, scintillation counters.
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Labtron Equipment Ltd., Quatro House, Lyon Way, Camberley, Surrey GU16 7ER United Kingdom
Email: info@labtron.com Whatsapp: +44 73 4441 2688 Phone: +44 2080 043608
