XRF Spectrometer LXRF-A10 operates at 15°C to 30°C and support trace level measurement with 1ppm detection limit for accurate elemental analysis. Its automatic sample changer accelerates throughput for high-volume analysis requirements efficiently. Feature vacuum technology that enhances sensitivity for light element under specific conditions. Require minimal maintenance and ensure cost-effective, long-term operational reliability. Offers calibration options to allow adaptation to diverse materials and analytical tasks effectively.
| Detection Limit | 1 ppm |
| Elemental Content | 1 ppm to 99 % |
| Temperature Range | 15°C to 30°C |
| Temperature Repeatability | 0.001 |
| Temperature Stability | 0.001 |
| Power Supply | AC 220 V ± 5 V |
| Dimensions (W×D×H) | 550 × 410 × 320 mm |
| Weight | 45 kg |
High-resolution spectral analysis
Energy-efficient operation design
Rapid non-destructive testing
Advanced digital control system
Multi-element detection capability
Include S to U measurable elements
Movable sample platform for easy detection
Built-in electric cooling Si-PIN detector
Optical tube shielding with no X-ray radiation
Our XRF Spectrometer LXRF-A10 ensures rapid, non-destructive elemental analysis for material testing in mining, industrial, and environmental applications and used for detection of plating thickness of metals, concentration of plating solution , RoHS detection and analysis, full-element analysis and electro plating industries
Labtron Equipment Ltd., Quatro House, Lyon Way, Camberley, Surrey GU16 7ER United Kingdom
Email: info@labtron.com Whatsapp: +44 73 4441 2688 Phone: +44 2080 043608
info@labtron.com
